Capabilities/Optical Characterization

Optical Characterization

Comprehensive optical characterization services spanning 3D profilometry, surface roughness analysis, particle size distribution, contact angle measurement, and optical spectroscopy.

Optical Microscopy

Nikon Eclipse L200 Optical Microscope

A microscope capable of greater contrast, high resolving power, and darkfield images. Used for precise optical inspection of wafers, photomasks, reticles, and other substrates.

Magnification5× – 100× objectives

IlluminationBrightfield, darkfield, DIC

Sample SizeUp to 200 mm wafers

Best ForLithography inspection, defect review

Confocal Laser Scanning Microscope

Provides optical sectioning and 3D reconstruction of fluorescently labeled samples and thin films for biological and materials science applications.

Lateral Resolution~ 200 nm (diffraction-limited)

Axial Resolution~ 500 nm (optical sectioning)

Laser Lines405, 488, 561, 640 nm

Sample SizeStandard microscopy slides and dishes

3D Optical Profilometry

KLA Zeta-20 Optical Profilometer

A fully integrated optical profiling microscope providing 3D metrology and imaging with confocal, interferometry, and reflectometry modes.

Vertical Resolution< 1 nm (VSI); < 0.1 nm (PSI)

Lateral Resolution0.4 µm (50× objective)

Measurement Range0.1 nm – 10 mm (vertical)

Sample SizeUp to 300 mm diameter

Filmetrics F3 Film Thickness Spectral Reflectometer

Measures thin-film thickness and refractive index in under 3 seconds using spectral reflectometry.

Thickness Range2 nm – 70 µm

Wavelength Range380–1050 nm

Spot Size~ 1 mm (standard)

MaterialsSiO₂, SiNx, photoresist, polymers

Woollam RC2 Spectroscopic Ellipsometer

A rotating compensator ellipsometer for measuring film thickness, optical constants (n, k), and material properties across a broad spectral range.

Spectral Range190–1700 nm

Thickness Range0.1 nm – several µm

Angle of Incidence45°–90° (variable)

MaterialsDielectrics, semiconductors, metals, organics

Particle Size & Surface Analysis

Dynamic Light Scattering (DLS)

Measures particle size distribution and zeta potential of nanoparticles and colloids in suspension.

Size Range1 nm – 10 µm (hydrodynamic diameter)

Concentration Range0.1 mg/mL – 40% w/v

Temperature Range2–90°C

MaterialsNanoparticles, liposomes, polymers in suspension

Contact Angle Goniometer

Measures static and dynamic contact angles to characterize surface wettability, hydrophobicity, and surface energy.

Angle Range0°–180°

Accuracy± 0.1°

Drop Volume0.5–30 µL

Best ForSurface treatment validation, microfluidic device development

Optical Spectroscopy

UV-Vis-NIR Spectrophotometer

Measures absorption, transmission, and reflectance spectra of thin films, solutions, and bulk materials across the UV-Vis-NIR range.

Spectral Range175–3300 nm

Spectral Resolution0.1–5 nm (adjustable)

Absorbance Range0–8 Abs

Sample FormatsSolutions, thin films, solids, powders

Photoluminescence (PL) Spectroscopy

Characterizes optical emission properties of semiconductors, quantum dots, and fluorescent materials with temperature-dependent and time-resolved capabilities.

Excitation Range300–800 nm (tunable laser)

Detection Range350–1700 nm

Temperature Range4 K – 800 K (with cryo stage)

MaterialsSemiconductors, QDs, perovskites, 2D materials